Nanotechnology New Hope for Thin Film Metrology Systems Market

San Francisco, California, Sept 05, 2017: Growing ubiquity of electronic gadgets and resilient focus on miniaturization of semiconductors will ensure a strong demand in the global thin film metrology systems market, according to a fresh study by TMR Research. The report, titled “Thin Film Metrology Systems Market – Global Industry Analysis, Size, Share, Trends, Analysis, Growth, and Forecast 2017 – 2025,” is a business tool, developed by experienced market research analysts, aspiring to provide quantitative and qualitative insights into the essential aspects of the market. The report analyzes all factors that will influence the demand for thin film metrology systems in the near future, positively or negatively, segments it into smaller parts, gauges the potential of various regions, and profiles some of the key companies to represent the competitive landscape.

As per the findings of the report, thin film metrology systems are primarily used to calculate the film thickness with high degree of accuracy. These systems are needed during the thin film deposition processes to measure and monitor parameters such as resistivity, thickness, and stress. Ellipsometry, profilometry, spectroscopic reflectrometry, and X-ray analysis are some of the common technologies. These technologies perform an important role in the manufacturing of complex semiconductor devices such as memory chip devices, transistors, motherboards, and many others. Thin film metrology systems are commonly applied to maintain the uniformity of the production-process. In the present scenario, electrical and electronics industry serves the maximum demand in the thin film metrology systems market as an end-user, due to widespread application base in semiconductor manufacturing process. The developing field of nanotechnology is also expected to reflect positively on this market.

High level of integration in order to add functionalities on individual devices is fueling the need for miniaturization of integrated circuits (ICs). Increased level of complexity in ICs and extensive research and development that are underway to improve the efficiency of semiconductors manufacturing processes are two factors that are expected to keep the demand augmenting in the global thin film metrology systems market. On the other hand, demand fluctuations or the cyclic nature of the semiconductor industry is seen as a possible hindrance of the prosperity of this market.

Based on end-users, the global thin film metrology systems market can be segmented into original devices manufacturer (ODM), original equipment manufacturer (OEM), and foundries. Geographically, the report explores the potential of thin film metrology systems market in every important region, such as North America, Asia Pacific, Europe, and the Middle East and Africa.

Some of the key companies currently holding a position of strength in the global thin film metrology systems market are: Nanometrics, KLA-Tencor, Rudolph Technologies, Nova Measuring Instruments, Hitachi High-Technologies, Semilab, and SCREEN Holdings.

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